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调试TMS320F28335芯片出现如下问题,检查仿真器是正常工作的,换过CCS软件,还是下面的问题

(Error -233 @ 0x0)
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.
(Emulation package 5