JTAG ID= 0x0b9a602f. This is a K2E device, version variant = 0
DEVSTAT= 0x00000661. little endian, no boot or I2C slave boot, boot master is ARM core, PLL configuration implies the input clock for core is 100MHz
SmartReflex VID= 46, required core voltage= 0.995V.
Die ID= 0x0600c004, 0x0c00ea85, 0x00000000, 0x79900000
DSP speed grade = 800MHz, ARM speed grade= 800MHz
Enable IRQ and FIQ.
Enable Exception handling...
Initialize main core clock = 100.00MHz/1x12 = 1200MHz
DDR3A initialization
Initialize DDR data rate = 100.000/1*16/4*4= 1600.0 MTS, bus width = 64 bits.
DDR PHY status PGSR0=0xb0000fff.
I2C 0 expected speed = 400KHz, effective speed = 396KHz
I2C 0 loopback test passed with data pattern 0x0. Throughput= 363Kbps
I2C 0 loopback test passed with data pattern 0xff. Throughput= 363Kbps
I2C 0 loopback test passed with data pattern 0x55. Throughput= 363Kbps
I2C 1 expected speed = 400KHz, effective speed = 396KHz
I2C 1 loopback test passed with data pattern 0x0. Throughput= 363Kbps
I2C 1 loopback test passed with data pattern 0xff. Throughput= 363Kbps
I2C 1 loopback test passed with data pattern 0x55. Throughput= 363Kbps
I2C 2 expected speed = 400KHz, effective speed = 396KHz
I2C 2 loopback test passed with data pattern 0x0. Throughput= 363Kbps
I2C 2 loopback test passed with data pattern 0xff. Throughput= 363Kbps
I2C 2 loopback test passed with data pattern 0x55. Throughput= 363Kbps
I2C 0 expected speed = 400KHz, effective speed = 396KHz
I2C EEPROM test start...
Save data from 0x0f000 to 0x0f400.
Passed I2C_EEPROM Fill Test from 0x f000 to 0x f400 with pattern 0x       0
Passed I2C_EEPROM Fill Test from 0x f000 to 0x f400 with pattern 0xffffffff
Passed I2C_EEPROM Fill Test from 0x f000 to 0x f400 with pattern 0xaaaaaaaa
Passed I2C_EEPROM Fill Test from 0x f000 to 0x f400 with pattern 0x55555555
Passed I2C_EEPROM Address Test from 0x f000 to 0x f400
Restore data from 0x0f000 to 0x0f400.
Save data from 0x0f400 to 0x0f800.
Passed I2C_EEPROM Fill Test from 0x f400 to 0x f800 with pattern 0x       0
Passed I2C_EEPROM Fill Test from 0x f400 to 0x f800 with pattern 0xffffffff
Passed I2C_EEPROM Fill Test from 0x f400 to 0x f800 with pattern 0xaaaaaaaa
Passed I2C_EEPROM Fill Test from 0x f400 to 0x f800 with pattern 0x55555555
Passed I2C_EEPROM Address Test from 0x f400 to 0x f800
Restore data from 0x0f400 to 0x0f800.
Save data from 0x0f800 to 0x0fc00.
Passed I2C_EEPROM Fill Test from 0x f800 to 0x fc00 with pattern 0x       0
Passed I2C_EEPROM Fill Test from 0x f800 to 0x fc00 with pattern 0xffffffff
Passed I2C_EEPROM Fill Test from 0x f800 to 0x fc00 with pattern 0xaaaaaaaa
Passed I2C_EEPROM Fill Test from 0x f800 to 0x fc00 with pattern 0x55555555
Passed I2C_EEPROM Address Test from 0x f800 to 0x fc00
Restore data from 0x0f800 to 0x0fc00.
Save data from 0x0fc00 to 0x10000.
Passed I2C_EEPROM Fill Test from 0x fc00 to 0x10000 with pattern 0x       0
Passed I2C_EEPROM Fill Test from 0x fc00 to 0x10000 with pattern 0xffffffff
Passed I2C_EEPROM Fill Test from 0x fc00 to 0x10000 with pattern 0xaaaaaaaa
Passed I2C_EEPROM Fill Test from 0x fc00 to 0x10000 with pattern 0x55555555
Passed I2C_EEPROM Address Test from 0x fc00 to 0x10000
Restore data from 0x0fc00 to 0x10000.
I2C test complete.
