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Capacitive Touch Library
Description of the Capacitive Touch Library
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Functions | |
| void | TI_CTS_RO_COMPAp_TA0_WDTp_HAL (const struct Sensor *group, uint16_t *counts) |
| RO method capactiance measurement using CompA+, TimerA0, and WDT+. | |
| void | TI_CTS_fRO_COMPAp_TA0_SW_HAL (const struct Sensor *group, uint16_t *counts) |
| RO method capactiance measurement using CompA+, TimerA0, and SW loop. | |
| void | TI_CTS_fRO_COMPAp_SW_TA0_HAL (const struct Sensor *group, uint16_t *counts) |
| RO method capactiance measurement using CompA+, TimerA0, and SW loop. | |
| void | TI_CTS_RO_COMPAp_TA1_WDTp_HAL (const struct Sensor *group, uint16_t *counts) |
| RO method capactiance measurement using CompA+, TimerA1, and WDT+. | |
| void | TI_CTS_fRO_COMPAp_TA1_SW_HAL (const struct Sensor *group, uint16_t *counts) |
| RO method capactiance measurement using CompA+, TimerA1, and SW loop. | |
| void | TI_CTS_RC_PAIR_TA0_HAL (const struct Sensor *group, uint16_t *counts) |
| RC method capactiance measurement using a Pair of GPIO and TimerA0. | |
| void | TI_CTS_fRO_PINOSC_TA0_SW_HAL (const struct Sensor *group, uint16_t *counts) |
| fRO method capactiance measurement using the PinOsc and TimerA0 | |
| void | TI_CTS_RO_PINOSC_TA0_WDTp_HAL (const struct Sensor *group, uint16_t *counts) |
| RO method capactiance measurement using PinOsc IO, TimerA0, and WDT+. | |
| void | TI_CTS_RO_PINOSC_TA0_HAL (const struct Sensor *group, uint16_t *counts) |
| RO method capactiance measurement using PinOsc IO, and TimerA0. | |
| void | TI_CTS_RO_COMPB_TA0_WDTA_HAL (const struct Sensor *group, uint16_t *counts) |
| RO method capactiance measurement using CompB, TimerA0, and WDTA. | |
| void | TI_CTS_RO_COMPB_TA1_WDTA_HAL (const struct Sensor *group, uint16_t *counts) |
| RO method capactiance measurement using CompB, TimerA1, and WDTA. | |
| void | TI_CTS_fRO_COMPB_TA0_SW_HAL (const struct Sensor *group, uint16_t *counts) |
| fRO method capactiance measurement using CompB, TimerA0 | |
| void | TI_CTS_fRO_COMPB_TA1_SW_HAL (const struct Sensor *group, uint16_t *counts) |
| fRO method capactiance measurement using CompB, TimerA1 | |
| __interrupt void | watchdog_timer (void) |
| void TI_CTS_fRO_COMPAp_SW_TA0_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
RO method capactiance measurement using CompA+, TimerA0, and SW loop.
Schematic Description of CompA+ forming relaxation oscillator.
<- Output
-> Input
R Resistor (typically 100Kohms)
+-<-Px.y (reference)
|
R
|
+---+-->COMPA+
| |
R R
| |
GND |
|
|
element-+-R--+-<-CAOUT
|
+------->COMPA-
The SW loop counts to 'n' accumulationCycles, representing the
measurement window. The number of timer counts within TA0R register
represents the capacitance of the element.
| group | Address of the structure describing the Sensor to be measured |
| counts | Address to where the measurements are to be written |
| void TI_CTS_fRO_COMPAp_TA0_SW_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
RO method capactiance measurement using CompA+, TimerA0, and SW loop.
Schematic Description of CompA+ forming relaxation oscillator.
<- Output
-> Input
R Resistor (typically 100Kohms)
+-<-Px.y (reference)
|
R
|
+---+-->COMPA+
| |
R R
| |
GND |
|
+-->TACLK
|
element-+-R--+-<-CAOUT
|
+------->COMPA-
The timer counts to TA0CCR0 representing the measurement window. The number of counts within the SW loop that have accumulated during the measurement window represents the capacitance of the element.
| group | Address of the structure describing the Sensor to be measured |
| counts | Address to where the measurements are to be written |
| void TI_CTS_fRO_COMPAp_TA1_SW_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
RO method capactiance measurement using CompA+, TimerA1, and SW loop.
Schematic Description of CompA+ forming relaxation oscillator.
<- Output
-> Input
R Resistor (typically 100Kohms)
+-<-Px.y (reference)
|
R
|
+---+-->COMPA+
| |
R R
| |
GND |
|
+-->TA1CLK
|
element-+-R--+-<-CAOUT
|
+------->COMPA-
The timer counts to TA1CCR0 representing the measurement window. The number of counts within the SW loop that have accumulated during the measurement window represents the capacitance of the element.
| group | Address of the structure describing the Sensor to be measured |
| counts | Address to where the measurements are to be written |
| void TI_CTS_fRO_COMPB_TA0_SW_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
fRO method capactiance measurement using CompB, TimerA0
Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0. <- Output -> Input R Resistor (typically 100Kohms)
element---R----<-CBOUT
The TAR reister value is the number of SW loops (function of MCLK) within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.
| group | Address of the structure describing the Sensor to be measured |
| counts | Address to where the measurements are to be written |
| void TI_CTS_fRO_COMPB_TA1_SW_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
fRO method capactiance measurement using CompB, TimerA1
Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA1. <- Output -> Input R Resistor (typically 100Kohms)
element---R----<-CBOUT
The TAR reister value is the number of SW loops (function of MCLK) within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.
| group | Address of the structure describing the Sensor to be measured |
| counts | Address to where the measurements are to be written |
| void TI_CTS_fRO_PINOSC_TA0_SW_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
fRO method capactiance measurement using the PinOsc and TimerA0
Charge and Discharge Cycle
+
+ +
+ +
+ +
+ +
Start Timer After n cycles Stop Timer
The TAR reister value is the number of SW loops (function of MCLK) within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.
| group | Address of the structure describing the Sensor to be measured |
| counts | Address to where the measurements are to be written |
| void TI_CTS_RC_PAIR_TA0_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
RC method capactiance measurement using a Pair of GPIO and TimerA0.
Schematic Description of two GPIO forming RC measruement.
<- Output
-> Input
R Resistor (typically 1Mohms)
+-<-Px.y (reference)
|
R
|
Element---+-->Pa.b
Charge and Discharge Cycle
+
+ +
+ +
+ +
+ +
Start Timer After n cycles Stop Timer
The TAR reister value is the number of SMCLK periods within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.
| group | Address of the structure describing the Sensor to be measured |
| counts | Address to where the measurements are to be written |
| void TI_CTS_RO_COMPAp_TA0_WDTp_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
RO method capactiance measurement using CompA+, TimerA0, and WDT+.
Schematic Description of CompA+ forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0.
<- Output
-> Input
R Resistor (typically 100Kohms)
+-<-Px.y (reference)
|
R
|
+---+-->COMPA+
| |
R R
| |
GND |
|
+-->TACLK
|
element-+-R--+-<-CAOUT
|
+------->COMPA-
The WDT+ interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.
| group | Address of the structure describing the Sensor to be measured |
| counts | Address to where the measurements are to be written |
| void TI_CTS_RO_COMPAp_TA1_WDTp_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
RO method capactiance measurement using CompA+, TimerA1, and WDT+.
Schematic Description of CompA+ forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0.
<- Output
-> Input
R Resistor (typically 100Kohms)
+-<-Px.y (reference)
|
R
|
+---+-->COMPA+
| |
R R
| |
GND |
|
+-->TA1CLK
|
element-+-R--+-<-CAOUT
|
+------->COMPA-
The WDT+ interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.
| group | Address of the structure describing the Sensor to be measured |
| counts | Address to where the measurements are to be written |
| void TI_CTS_RO_COMPB_TA0_WDTA_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
RO method capactiance measurement using CompB, TimerA0, and WDTA.
Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0.
<- Output
-> Input
R Resistor (typically 100Kohms)
element---R----<-CBOUT/TA0CLK
The WDTA interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.
| group | Address of the structure describing the Sensor to be measured |
| counts | Address to where the measurements are to be written |
| void TI_CTS_RO_COMPB_TA1_WDTA_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
RO method capactiance measurement using CompB, TimerA1, and WDTA.
Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA1. <- Output -> Input R Resistor (typically 100Kohms)
element---R----<-CBOUT/TA1CLK
The WDTA interval represents the measurement window. The number of counts within the TA1R that have accumulated during the measurement window represents the capacitance of the element.
| group | Address of the structure describing the Sensor to be measured |
| counts | Address to where the measurements are to be written |
| void TI_CTS_RO_PINOSC_TA0_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
RO method capactiance measurement using PinOsc IO, and TimerA0.
Schematic Description:
element-----+->Px.y
The measurement window is accumulation_cycles/ACLK. The ACLK is used to generate a capture event via the internal connection CCIOB. The counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.
| group | Pointer to the structure describing the Sensor to be measured |
| counts | Pointer to where the measurements are to be written |
| void TI_CTS_RO_PINOSC_TA0_WDTp_HAL | ( | const struct Sensor * | group, |
| uint16_t * | counts | ||
| ) |
RO method capactiance measurement using PinOsc IO, TimerA0, and WDT+.
Schematic Description:
element-----+->Px.y
The WDT+ interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.
| group | Pointer to the structure describing the Sensor to be measured |
| counts | Pointer to where the measurements are to be written |
1.7.3
