Capacitive Touch Library
Description of the Capacitive Touch Library
|
Functions | |
void | TI_CTS_RO_COMPAp_TA0_WDTp_HAL (const struct Sensor *group, uint16_t *counts) |
RO method capactiance measurement using CompA+, TimerA0, and WDT+. | |
void | TI_CTS_fRO_COMPAp_TA0_SW_HAL (const struct Sensor *group, uint16_t *counts) |
RO method capactiance measurement using CompA+, TimerA0, and SW loop. | |
void | TI_CTS_fRO_COMPAp_SW_TA0_HAL (const struct Sensor *group, uint16_t *counts) |
RO method capactiance measurement using CompA+, TimerA0, and SW loop. | |
void | TI_CTS_RO_COMPAp_TA1_WDTp_HAL (const struct Sensor *group, uint16_t *counts) |
RO method capactiance measurement using CompA+, TimerA1, and WDT+. | |
void | TI_CTS_fRO_COMPAp_TA1_SW_HAL (const struct Sensor *group, uint16_t *counts) |
RO method capactiance measurement using CompA+, TimerA1, and SW loop. | |
void | TI_CTS_RC_PAIR_TA0_HAL (const struct Sensor *group, uint16_t *counts) |
RC method capactiance measurement using a Pair of GPIO and TimerA0. | |
void | TI_CTS_fRO_PINOSC_TA0_SW_HAL (const struct Sensor *group, uint16_t *counts) |
fRO method capactiance measurement using the PinOsc and TimerA0 | |
void | TI_CTS_RO_PINOSC_TA0_WDTp_HAL (const struct Sensor *group, uint16_t *counts) |
RO method capactiance measurement using PinOsc IO, TimerA0, and WDT+. | |
void | TI_CTS_RO_PINOSC_TA0_HAL (const struct Sensor *group, uint16_t *counts) |
RO method capactiance measurement using PinOsc IO, and TimerA0. | |
void | TI_CTS_RO_COMPB_TA0_WDTA_HAL (const struct Sensor *group, uint16_t *counts) |
RO method capactiance measurement using CompB, TimerA0, and WDTA. | |
void | TI_CTS_RO_COMPB_TA1_WDTA_HAL (const struct Sensor *group, uint16_t *counts) |
RO method capactiance measurement using CompB, TimerA1, and WDTA. | |
void | TI_CTS_fRO_COMPB_TA0_SW_HAL (const struct Sensor *group, uint16_t *counts) |
fRO method capactiance measurement using CompB, TimerA0 | |
void | TI_CTS_fRO_COMPB_TA1_SW_HAL (const struct Sensor *group, uint16_t *counts) |
fRO method capactiance measurement using CompB, TimerA1 | |
__interrupt void | watchdog_timer (void) |
void TI_CTS_fRO_COMPAp_SW_TA0_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
RO method capactiance measurement using CompA+, TimerA0, and SW loop.
Schematic Description of CompA+ forming relaxation oscillator.
<- Output
-> Input
R Resistor (typically 100Kohms)
+-<-Px.y (reference)
|
R
|
+---+-->COMPA+
| |
R R
| |
GND |
|
|
element-+-R--+-<-CAOUT
|
+------->COMPA-
The SW loop counts to 'n' accumulationCycles, representing the
measurement window. The number of timer counts within TA0R register
represents the capacitance of the element.
group | Address of the structure describing the Sensor to be measured |
counts | Address to where the measurements are to be written |
void TI_CTS_fRO_COMPAp_TA0_SW_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
RO method capactiance measurement using CompA+, TimerA0, and SW loop.
Schematic Description of CompA+ forming relaxation oscillator.
<- Output
-> Input
R Resistor (typically 100Kohms)
+-<-Px.y (reference)
|
R
|
+---+-->COMPA+
| |
R R
| |
GND |
|
+-->TACLK
|
element-+-R--+-<-CAOUT
|
+------->COMPA-
The timer counts to TA0CCR0 representing the measurement window. The number of counts within the SW loop that have accumulated during the measurement window represents the capacitance of the element.
group | Address of the structure describing the Sensor to be measured |
counts | Address to where the measurements are to be written |
void TI_CTS_fRO_COMPAp_TA1_SW_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
RO method capactiance measurement using CompA+, TimerA1, and SW loop.
Schematic Description of CompA+ forming relaxation oscillator.
<- Output
-> Input
R Resistor (typically 100Kohms)
+-<-Px.y (reference)
|
R
|
+---+-->COMPA+
| |
R R
| |
GND |
|
+-->TA1CLK
|
element-+-R--+-<-CAOUT
|
+------->COMPA-
The timer counts to TA1CCR0 representing the measurement window. The number of counts within the SW loop that have accumulated during the measurement window represents the capacitance of the element.
group | Address of the structure describing the Sensor to be measured |
counts | Address to where the measurements are to be written |
void TI_CTS_fRO_COMPB_TA0_SW_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
fRO method capactiance measurement using CompB, TimerA0
Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0. <- Output -> Input R Resistor (typically 100Kohms)
element---R----<-CBOUT
The TAR reister value is the number of SW loops (function of MCLK) within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.
group | Address of the structure describing the Sensor to be measured |
counts | Address to where the measurements are to be written |
void TI_CTS_fRO_COMPB_TA1_SW_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
fRO method capactiance measurement using CompB, TimerA1
Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA1. <- Output -> Input R Resistor (typically 100Kohms)
element---R----<-CBOUT
The TAR reister value is the number of SW loops (function of MCLK) within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.
group | Address of the structure describing the Sensor to be measured |
counts | Address to where the measurements are to be written |
void TI_CTS_fRO_PINOSC_TA0_SW_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
fRO method capactiance measurement using the PinOsc and TimerA0
Charge and Discharge Cycle
+
+ +
+ +
+ +
+ +
Start Timer After n cycles Stop Timer
The TAR reister value is the number of SW loops (function of MCLK) within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.
group | Address of the structure describing the Sensor to be measured |
counts | Address to where the measurements are to be written |
void TI_CTS_RC_PAIR_TA0_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
RC method capactiance measurement using a Pair of GPIO and TimerA0.
Schematic Description of two GPIO forming RC measruement.
<- Output
-> Input
R Resistor (typically 1Mohms)
+-<-Px.y (reference)
|
R
|
Element---+-->Pa.b
Charge and Discharge Cycle
+
+ +
+ +
+ +
+ +
Start Timer After n cycles Stop Timer
The TAR reister value is the number of SMCLK periods within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.
group | Address of the structure describing the Sensor to be measured |
counts | Address to where the measurements are to be written |
void TI_CTS_RO_COMPAp_TA0_WDTp_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
RO method capactiance measurement using CompA+, TimerA0, and WDT+.
Schematic Description of CompA+ forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0.
<- Output
-> Input
R Resistor (typically 100Kohms)
+-<-Px.y (reference)
|
R
|
+---+-->COMPA+
| |
R R
| |
GND |
|
+-->TACLK
|
element-+-R--+-<-CAOUT
|
+------->COMPA-
The WDT+ interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.
group | Address of the structure describing the Sensor to be measured |
counts | Address to where the measurements are to be written |
void TI_CTS_RO_COMPAp_TA1_WDTp_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
RO method capactiance measurement using CompA+, TimerA1, and WDT+.
Schematic Description of CompA+ forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0.
<- Output
-> Input
R Resistor (typically 100Kohms)
+-<-Px.y (reference)
|
R
|
+---+-->COMPA+
| |
R R
| |
GND |
|
+-->TA1CLK
|
element-+-R--+-<-CAOUT
|
+------->COMPA-
The WDT+ interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.
group | Address of the structure describing the Sensor to be measured |
counts | Address to where the measurements are to be written |
void TI_CTS_RO_COMPB_TA0_WDTA_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
RO method capactiance measurement using CompB, TimerA0, and WDTA.
Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0.
<- Output
-> Input
R Resistor (typically 100Kohms)
element---R----<-CBOUT/TA0CLK
The WDTA interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.
group | Address of the structure describing the Sensor to be measured |
counts | Address to where the measurements are to be written |
void TI_CTS_RO_COMPB_TA1_WDTA_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
RO method capactiance measurement using CompB, TimerA1, and WDTA.
Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA1. <- Output -> Input R Resistor (typically 100Kohms)
element---R----<-CBOUT/TA1CLK
The WDTA interval represents the measurement window. The number of counts within the TA1R that have accumulated during the measurement window represents the capacitance of the element.
group | Address of the structure describing the Sensor to be measured |
counts | Address to where the measurements are to be written |
void TI_CTS_RO_PINOSC_TA0_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
RO method capactiance measurement using PinOsc IO, and TimerA0.
Schematic Description:
element-----+->Px.y
The measurement window is accumulation_cycles/ACLK. The ACLK is used to generate a capture event via the internal connection CCIOB. The counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.
group | Pointer to the structure describing the Sensor to be measured |
counts | Pointer to where the measurements are to be written |
void TI_CTS_RO_PINOSC_TA0_WDTp_HAL | ( | const struct Sensor * | group, |
uint16_t * | counts | ||
) |
RO method capactiance measurement using PinOsc IO, TimerA0, and WDT+.
Schematic Description:
element-----+->Px.y
The WDT+ interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.
group | Pointer to the structure describing the Sensor to be measured |
counts | Pointer to where the measurements are to be written |