[DATALOG] Test# APin PF Value L-Limit U-Limit SK# Comment 0 18 P -529.365 mV -1.200 V -200.000 mV 0 os_test (G1(18)) 0 20 P -529.548 mV -1.200 V -200.000 mV 0 os_test (G2A(20)) 0 19 P -529.059 mV -1.200 V -200.000 mV 0 os_test (G2B(19)) 0 21 P -526.571 mV -1.200 V -200.000 mV 0 os_test (C1(21)) 0 22 P -529.998 mV -1.200 V -200.000 mV 0 os_test (B1(22)) 0 23 P -530.515 mV -1.200 V -200.000 mV 0 os_test (A1(23)) 0 49 P -589.495 mV -1.200 V -200.000 mV 0 os_test (Y0(49)) 0 50 P -590.322 mV -1.200 V -200.000 mV 0 os_test (Y1(50)) 0 51 P -586.206 mV -1.200 V -200.000 mV 0 os_test (Y2(51)) 0 52 P -586.739 mV -1.200 V -200.000 mV 0 os_test (Y3(52)) 0 53 P -587.154 mV -1.200 V -200.000 mV 0 os_test (Y4(53)) 0 54 P -588.745 mV -1.200 V -200.000 mV 0 os_test (Y5(54)) 0 55 P -588.291 mV -1.200 V -200.000 mV 0 os_test (Y6(55)) 0 17 P -588.542 mV -1.200 V -200.000 mV 0 os_test (Y7(17)) 1 256 P -493.015 mV -1.200 V -200.000 mV 0 power_os_test (VCC(256)) 11 = P - - - - - - 0 Vcc_5.50V_VI=7V_ii_test 11 21 P +156.808 nA -100.000 uA +100.000 uA 0 Vcc_5.50V_VI=7V_ii_test (C1(21)) 11 22 P -323.475 nA -100.000 uA +100.000 uA 0 Vcc_5.50V_VI=7V_ii_test (B1(22)) 11 23 P +630.601 nA -100.000 uA +100.000 uA 0 Vcc_5.50V_VI=7V_ii_test (A1(23)) 11 18 P -778.427 nA -100.000 uA +100.000 uA 0 Vcc_5.50V_VI=7V_ii_test (G1(18)) 11 20 P -321.059 nA -100.000 uA +100.000 uA 0 Vcc_5.50V_VI=7V_ii_test (G2A(20)) 11 19 P -781.224 nA -100.000 uA +100.000 uA 0 Vcc_5.50V_VI=7V_ii_test (G2B(19)) 11 = P - - - - - - 0 Vcc_5.50V_VI=0.4V_iil_test 11 18 P -241.514 uA -400.000 uA +400.000 uA 0 Vcc_5.50V_VI=0.4V_iil_test (G1(18)) 11 20 P -243.769 uA -400.000 uA +400.000 uA 0 Vcc_5.50V_VI=0.4V_iil_test (G2A(20)) 11 19 P -236.717 uA -400.000 uA +400.000 uA 0 Vcc_5.50V_VI=0.4V_iil_test (G2B(19)) 11 21 *F -240.632 uA -200.000 uA +200.000 uA 0 Vcc_5.50V_VI=0.4V_iil_test (C1(21)) 11 22 *F -241.884 uA -200.000 uA +200.000 uA 0 Vcc_5.50V_VI=0.4V_iil_test (B1(22)) 11 23 *F -239.449 uA -200.000 uA +200.000 uA 0 Vcc_5.50V_VI=0.4V_iil_test (A1(23)) 11 = P - - - - - - 0 Vcc_5.50V_VI=2.7V_iih_test 11 21 P +11.977 nA -20.000 uA +20.000 uA 0 Vcc_5.50V_VI=2.7V_iih_test (C1(21)) 11 22 P -10.627 nA -20.000 uA +20.000 uA 0 Vcc_5.50V_VI=2.7V_iih_test (B1(22)) 11 23 P +27.115 nA -20.000 uA +20.000 uA 0 Vcc_5.50V_VI=2.7V_iih_test (A1(23)) 11 18 P -30.464 nA -20.000 uA +20.000 uA 0 Vcc_5.50V_VI=2.7V_iih_test (G1(18)) 11 20 P -19.164 nA -20.000 uA +20.000 uA 0 Vcc_5.50V_VI=2.7V_iih_test (G2A(20)) 11 19 P -31.763 nA -20.000 uA +20.000 uA 0 Vcc_5.50V_VI=2.7V_iih_test (G2B(19)) [TESTDATA] SK# Serial# PF HBin# SBin# Xadr Yadr 0 0 *F 7 7 -1024 -1024 ************************************************************************