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TMS320F28335PTPQ在烧写出现图中所述故障

Other Parts Discussed in Thread: UNIFLASH

TMS320F28335PTPQ在烧写出现图中所述故障
Load   program error.
File:
F:/helz\JCWT51-062_Software_v1.00\Debug\JCWT51-062_Software_v
1.00.out:a data verification error occurred, file load failed

Error connecting to the target
(Err-233@0x0)
The JTAG IR and DR scan-paths cannot circulate bits,they may be broken.
An attempt to scan the JTAG scan-path has failed
The target's TJAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault
这2个是TJAG烧写出现的问题

***PLEASE RESET TARGET IN SCI BOOT-LOADER MODE***
Connecting with target(autobaud)...OK.
Bootloading...OK.
Please wait...
Connecting with target...
-Chip ID:0xEF
-Chip Rev:0x01
OK.
Unlocking target...failed(wrong key)!
这个是串口烧写出现的问题!
有遇见一样问题的,麻烦帮忙协助一下类似案例,谢谢!

  • 请您先看一下

    software-dl.ti.com/.../ccsv7_debugging_jtag_connectivity_issues.html

    另外您现在使用的是自己设计的板子?是否有进行加密?
  • 1.烧录的程序是CCS6.1开发的
    2.在线仿真和下载都使用了
    3.烧录器是XDS560PLUS
    4.电路板是自己设计的
  • 谢谢您的反馈。

    在上述链接中,您的 data read back是什么数值?就是下面这种。可以根据链接内具体提示以及说明来确认问题

    另外是否有使用uniflash连接一下试试?

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.


    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0x0000003F.
    Scan tests: 2, skipped: 0, failed: 2
    Do a test using 0xFE03E0E2.
    Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0x80F83880.
    Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0x80F838BF.
    Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0x80F838BF.
    Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0x80F838BF.
    Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0x80F838BF.
    Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0x80F838BF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 3, skipped: 0, failed: 3
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 4
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 5
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 6
    Some of the values were corrupted - 66.7 percent.


    The JTAG IR Integrity scan-test has failed.
  • 是否可以先上板后再做烧录?
  • 为什么在烧写的时候出现DSP给锁死了
  • 所以您现在回读数据是多少?

    “为什么在烧写的时候出现DSP给锁死了”

    是有烧写密码还是其他操作?若是可以的话,请您详细说明一下,我对您现在的情况有些疑惑