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https://e2e.ti.com/support/power-management-group/power-management/f/power-management-forum/752725/tps2388-chip-damaged-after-surge-testing
您好！
TPS2388在4KV 浪涌测试后损坏。 此测试在引脚 RJ45连接器处注入浪涌电压 、即使 每个 引脚上都有 TVSS、但 仍会发现 VDD 引脚损坏。
TI 能否提供有关"如何改进浪涌测试中的性能"的应用手册？
谢谢你。
C.T.
