我之前有咨询得知BQ35100在flash写操作时,由于耗流大,会导致内部LDO电压下降,这个对于芯片工作会有影响吗?比如这是否会导致此刻库仑计的电流或者电压的读数的误差?写操作时独到的参数与没有写操作时读到参数不一致?
This thread has been locked.
If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.
我之前有咨询得知BQ35100在flash写操作时,由于耗流大,会导致内部LDO电压下降,这个对于芯片工作会有影响吗?比如这是否会导致此刻库仑计的电流或者电压的读数的误差?写操作时独到的参数与没有写操作时读到参数不一致?
您好,请参考下面内容
Generally there's not a large amount of flash writes occurring during normal operation and while the gauge is taking a measurement, if the supply for the gauge is a resistive path and the voltage drops it could cause problems with the readings or gauge functionality, as long as the nodes are within recommended operating conditions even in a higher current state when writing flash the gauge should operate normally.