AWR6843ISK: AWR6843

请问您编译的是哪个toolbox里的例程？我这边编译mmwave_industrial_toolbox_4_7_0里的例程可以。

我编的是ToolBox-3.3.0的mmWave SDK CCS Projects下的例程，还有我用XDS仿真器连接AWR6843ISK板卡连接不上

[Start: Texas Instruments XDS110 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]

-----[Print the board config pathname(s)]------------------------------------

C:\Users\quanb\AppData\Local\TEXASI~1\CCS\
ccs1031\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Apr 29 2021'.
The library build time was '17:49:40'.
The library package version is '9.3.0.00058'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[An error has occurred and this utility has aborted]--------------------

This error is generated by TI's USCIF driver or utilities.

The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.

The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.

[End: Texas Instruments XDS110 USB Debug Probe_0]