问题描述：ADS1292r DC Lead-off配置无效，测试时，选择IN2P和IN2N通道进行测试，当导联脱落时，读取LOFF_STAT状态寄存器中的IN2N_OFF和IN2P_OFF位时，有时候位0，有时候为1，会处于一种不稳定的状态。测试方案是按照下图中b）方案进行测试的，想问一下，导联脱落的时候，为什么会出现IN2N_OFF和IN2P_OFF位时为0时为1的不稳定现象，ADS1292r各寄存器的配置如下，不知道如下配置是否有问题？
另外希望能详细解释一下FLIP1和FLIP2这2个寄存器的配置，因为感觉datasheet上面说的“The internal current source and current sink can be swapped by setting the FLIP1 and FLIP2 bits in the LOFF_SENS register. ”这句话很不好理解，另外寄存器的配置中，DC电流路径也不知道设置是否正确？
软件初始化配置：
ADS1292_SendCommand(ADS1292_CMD_SDATAC);
ADS1292_WriteRegister(ADS1292_REG_CONFIG1, 0x01); // continuous conversion mode,sample rate to 250sps
ADS1292_WriteRegister(ADS1292_REG_CONFIG2, 0xe0);//Lead-off comparators enabled
ADS1292_WriteRegister(ADS1292_REG_LOFF, 0xd0);//75% - 25%
ADS1292_WriteRegister(ADS1292_REG_CH1SET, 0x60);//pga = 12
ADS1292_WriteRegister(ADS1292_REG_CH2SET, 0x60);//pga = 12
ADS1292_WriteRegister(ADS1292_REG_RLD_SENS, 0x2f);
ADS1292_WriteRegister(ADS1292_REG_LOFF_SENS, 0x0F); // Turn on both P- and N-side of all channels for lead-off sensing
ADS1292_WriteRegister(ADS1292_REG_LOFF_STAT, 0x00);
ADS1292_WriteRegister(ADS1292_REG_RESP1, 0x02);
ADS1292_WriteRegister(ADS1292_REG_RESP2, 0x83);
ADS1292_WriteRegister(ADS1292_REG_GPIO, 0x00);
ADS1292_SendCommand(ADS1292_CMD_OFFSETCAL);
nrf_delay_ms(200);
寄存器配置简述如下
|
Reg |
value |
|
01 |
0x01 |
|
02 |
0xe0 |
|
03 |
0xd0 |
|
04 |
0x60 |
|
05 |
0x60 |
|
06 |
0x2f |
|
07
|
0x0f
|
|
08
|
0x00
|
|
09
|
0x02
|
|
0a
|
0x83
|
3
