近期有一起案件,是我司的UPS 有使用到到貴司MCU,因客戶端現場UPS出現異常,但卻沒有事件紀錄的存在
目前我司韌體懷疑MCU內部有問題,請問可將此MCU(已從板件取下來了),送貴司分析嗎?
1. Detail TI device failure symptom (including any available test logs, oscilloscope traces, Failure pin, failure data Vs TI datasheet, etc.)*
Ans: RAM memory data changes abnormally during MCU operation. RAM memory location where values may change: address 0xE10E, 0xE10D, 0xE10F, 0xE106, 0xE105, 0xE8CE.
2. Please clarify the reason the device is suspected to be non-conforming to the datasheet.
Ans: Through static program analysis tools, there is no possibility that the program may miswrite memory. So I want to check if there is any abnormality in the memory.
3. Is there pin-to-pin open/short or pin impedance anomaly when comparing with a known good unit? which pin?
Ans : No abnormality
4. Please provide device clear topside or backside marking pictures: ( the marking should be easily distinguish)
