This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

BQ40Z50-R2: 異常觸發CFETF PF 失效- 保護板無量測到異常現象

Part Number: BQ40Z50-R2

目前分析一失效客訴案例, 發現 CFETF 發生PF, 但是量測硬體都是正常

修復Fuse 後, 電池組也可以正常運作. 輸出 gg 檢測發現, 同時也有 ASCCL (Bit 14): Short Circuit in Charge 觸發

但是MOSFET 檢測是正常. 請問這有可能是甚麼因素所造成的.

附上 logNo4_T0001362108701496.gg.csv

  • 您好,正在询问更了解这款芯片的TI工程师,稍后回复。

  • 您好,请参考下面内容

    This means that at one point, the charging current exceeded the programmed threshold limits. It does not mean that the CFET is defective. It means that there was a current through the sense resistor during charging that was higher than the programmed limits. In fact, if the CFET was damaged (burned out open), then there would be no ASCCL event.

  • i am checking the record in Lifetimes. Max charge current show 2499mA. OCC1 was 3500 mA.

    no safety event found in Lifetimes record. How to judge the current exceeded? OCP should be worked before short circuit.

    i also cheking PCB, no component was abnormal exclude fuse. Short circuit should not be observed. 

    How CFET PF actived?    Should current not be zero after  ASCCL actived ? 

    Please advise if below idea is reasonable.

    1. A noise couple into sense resistor. Gauge read abnormal current 

    2.Surge event found during charging, cause sensing current abnormal

    3. Any the other factor?

    Lifetimes Current Max Charge Current 2499 mA
    Lifetimes Current Max Discharge Current -849 mA
    Lifetimes Current Max Avg Dsg Current -720 mA
    Lifetimes Current Max Avg Dsg Power -549 cW
    Lifetimes Safety Events No Of ASCC Events 0 events
    Lifetimes Safety Events Last ASCC Event 0 cycles

    Protections OCC1 Threshold 3500 mA
    Protections OCC1 Delay 6 s
    Protections OCC2 Threshold 4000 mA
    Protections OCC2 Delay 1 s
    Protections OCC Recovery Threshold -200 mA
    Protections OCC Recovery Delay 5 s
  • 您好,正在询问更了解这款芯片的TI工程师,稍后回复。

  • 您好,The gauge will not catch every current spike in Lifetimes (it is fairly conservative with updates to avoid premature flash wear and it also won't catch all spikes due to HW protection events, which can turn off the FETs before the coulomb counter ADC even had a chance to measure anything).

  • Hi 你好,請教有什麼更好的方式可以避免current spike

  • 您好,current spike取决于外部电源