This thread has been locked.
If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.
我们在测试过程中，出现了两次BQ25792充电芯片温度过高而烧毁的情况，但是我们无法复现，请问这可能是什么原因造成？
您好，请参考下面内容确认电路，layout请参考数据手册和评估版的用户手册推荐的layout
4162.BQ25790_BQ25792_BQ25672_V1p0_Schematic Checklist.pdf
