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ONET8551T老化问题

Other Parts Discussed in Thread: ONET8551T

尊敬的TI工程师:您好!

我们目前用TIONET8551T生产光通讯模块, burn-in完后TIA有接近0.3%的失效。

我们TO burn-in的条件如下:100C环境下,TIA3.3V电压,24hr

请帮忙确认我们公司QA同事询问的如下问题:

1. 可靠性报告(失效率及工作寿命)

2. 此款TIA是否需要做burn-in,如果需要,TI推荐的burn-in条件是?

3. 早期失效率 


以上,非常感谢!