TAS2780: Over-temperature and over-current testing methods for TAS2780

Hi,

There is no easy  way to trigger this, you may refer to below steps for a trial:

• Use a heat gun or heating plate to locally heat only the TAS2780 chip body (avoid thermal conduction to other modules)
• Before heating, disconnect or isolate the power supply of other modules that may be thermally affected (e.g., using relays or switches)
• Simultaneously monitor the IRQZ pin with an oscilloscope or logic analyzer to confirm whether it goes low
• Cool down immediately after heating to prevent chip damage (TAS2780 can tolerate short-term exposure to 150°C)

Pay attention for careful operation to avoid overheating damage.

Thanks, we have found a more easier way to trigger irqz to low.

But now we are facing an issue with TAS2780 OC protection handling.
When simulating OC trigger, TAS2780 correctly pulls down IRQ and the kernel sends uevent to HAL. However, due to the chip’s internal protection mechanism, it auto-restarts. As a result, HAL cannot read the fault status and reports “fault not detected”.
Question: Is it possible to disable this internal auto-restart? If yes, please advise how (register settings or other method).Thanks.