Part Number: AM26C31
We have two batches of AM26C31IPWR chips. One is the latest batch with revised die layout, and another one is the version before the die layout change.
Test Phenomenon
We used a digital multimeter in resistance mode for testing. The red probe was connected to pin 8 (GND), and the black probe was connected to output pins such as pin 2, pin 3, pin 5 and pin 6.
- The revised new-version chip measures approximately 0.5 MΩ between GND and the above output pins.
- The old-version chip (before layout revision) measures approximately 8 MΩ between GND and the same pins.
Two Questions to Consult
- Is the measured resistance of 0.5 MΩ for the newly revised chip a normal phenomenon caused by the die layout update?
- What is the root cause of the significantly lower resistance of the new chip compared with the old one?
