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这个是test pattern mode 的步骤： To start the test pattern generation, enable Test Mode using bit[1] of the Test and Scan Register (0x3D). Then load all parameters for the desired test pattern into the registers, and set Pattern Enable bit of the Test Pattern Control Register (0x34). Changing pattern parameters after the Pattern Enable bit is set may result in undesired output. The pattern will start at the next leading edge of CLPIN.
