Other Parts Discussed in Thread: TMDSEMU200-U
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器件型号： TMDSEMU200-U
主题中讨论的其他器件： TMDSEMU110-U
我们在使用 TMDSEMU200-U 调试探针时会遇到严重的可靠性问题。
我们目前拥有 4 个单位、其中 4 个单位在大约两年的正常使用期间逐渐退化、到现在几乎无法使用的地步。
主要问题是：
- 通过 USB 连接探头时、LED 不会亮起。
- Code Composer Studio 无法正确识别探针。
- 在检测到探头之前、我们必须多次断开并重新连接探头。
- 连接和未连接 MCU 时都会出现问题。
这种行为在所有四个器件中都是一致的、这表明可能存在硬件可靠性问题或元件会随着时间的推移而老化。
在这种情况下、“Test Connection“实用程序将完全失败、并显示以下错误：
[Start: Texas Instruments XDS2xx USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\MUDRIT~1.BAL\AppData\Local\TEXASI~1\
CCS\ccs1230\0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
E_RPCENV_IO_ERROR(-6) No connection: DTC_IO_Open::dtc_io
Failed to open i/o connection (xds2xxu:0)
An error occurred while soft opening the controller.
-----[An error has occurred and this utility has aborted]--------------------
This error is generated by TI's USCIF driver or utilities.
The value is '-250' (0xffffff06).
The title is 'SC_ERR_ECOM_EMUNAME'.
The explanation is:
An attempt to access the debug probe via USCIF ECOM has failed.
[End: Texas Instruments XDS2xx USB Debug Probe_0]在其他情况下、经过多次重新连接尝试后、最终会检测到探头并成功通过完整性扫描、如下所示：
[Start: Texas Instruments XDS2xx USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\MUDRIT~1.BAL\AppData\Local\TEXASI~1\
CCS\ccs1230\0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'Mar 10 2023'.
The library build time was '22:17:39'.
The library package version is '9.11.0.00128'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
This emulator does not create a reset log-file.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG IR Integrity scan-test has succeeded.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG DR Integrity scan-test has succeeded.
[End: Texas Instruments XDS2xx USB Debug Probe_0]您能否说明这是否是已知问题、是否有任何建议的故障排除步骤、维修选项或更换步骤？ 更改 PC（在 5/6 Windows 11 上尝试）不能解决问题。