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器件型号：MSP432E401YT REV B
-我最近使用 MSP432E401Y MCU 构建了一个板
但是、MCU 到处都没有库存、因此我从 MSP432E4 Launchpad 中移除了一个、并将其安装在我的定制板上。
-我正在使用 XDS110板载调试器对我的定制板进行编程。
-使用 PC0、PC1、PC2、PC3对我的定制板进行编程、电路和跳线看起来正常(原理图如下)
-使用连接到 XDS110的定制板
- TCK、TMS、TDI、TDO 和 TARGET_RESET
最初我收到错误：错误-615、目标未能看到正确格式的 SWD 报头
- 进行了一些研究、发现由于我将 MCU 从 Launchpad 中取出、它可能处于生产模式、因此我尝试使用将其恢复出厂设置
- 《使用 Uniflash 和 XDS 调试探针解锁序列》
- "dbgjtag.exe–f @xds110–Y 解锁、mode=msp432e4"
无论如何、我注意到模拟电压未连接、因此打开 后错误615消失
现在、当我在 CCXML 中测试与这些配置的连接时、我会得到：
[Start: Texas Instruments XDS110 USB Debug Probe]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\UTKARS~1.GUP\AppData\Local\TEXASI~1\
CCS\ccs930\0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Nov 25 2019'.
The library build time was '16:55:29'.
The library package version is '8.4.0.00006'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG IR Integrity scan-test has succeeded.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG DR Integrity scan-test has succeeded.
[End: Texas Instruments XDS110 USB Debug Probe]
当我尝试调试(对 MCU 进行编程)时：
Cortex_M4_0：GEL_OUTPUT：
内存映射初始化完成
Cortex_M4_0：JTAG 通信错误：(错误-1170 @ 0x0)无法访问 DAP。 重置设备、然后重试此操作。 如果错误仍然存在、请确认配置、对电路板进行下电上电和/或尝试更可靠的 JTAG 设置(例如、较低的 TCLK)。 (仿真包9.4.0.00129)
Cortex_M4_0： 在断开连接之前无法从目标中删除调试状态。
不确定在这里该做什么、请帮助！
- 我尝试将 TCLK 降低至2.5MHz、但问题仍然存在！
