[参考译文] XDS110ISO-EVM：XDS110ISO-EVM：无法连接到 TMS320F28374S

您好！

Unknown 说：

XDS110ISO-EVM 原理图显示、调试适配器接头 J3根本没有 nTRST。 是需要平台吗？ 根据 JTAG wikipage、nTRST 是可选的。

并非所有 MCU 都具有 nTRST 引脚、但对于具有 nTRST 引脚的 MCU、必须解决该问题。

如果 nTRST 保持低电平、则 JTAG 状态机将始终处于 Test-Logic-Reset 状态、并且 JTAG 通信将无法正常运行。  

如果 nTRST 保持高电平、那么 JTAG 编程器能够使用 TCK/TMS 来改变 JTAG 状态、并且能够正确通信。

如果无法从调试探针中获得 nTRST、则应该能够在对器件进行编程时仅将 nTRST 拉高。

此致、

Ben Collier

好的。 如果我手动将 nTRST 拉至高电平、似乎可以连接到目标。

太糟糕了、XDS110ISO-EVM 板的设计中没有专用的 nTRST 引脚。 也许德州仪器(TI)能够生产固件、 此固件将使用未来不用于 JTAG 的引脚 J3连接器中的一个作为 nTRST：)

编辑： 如果 nTRST 连接到 J3连接器中任何高电平引脚(例如引脚9 (MCU_RXD_ISO_SW)、则 XDS110ISO-EVM 工作。

C:\ti\ccs1280\ccs\ccs_base\common\uscif>dbgjtag.exe -f testBoard_f28374s.data -rv -o -S integrity

-----[Print the board config pathname(s)]------------------------------------

testBoard_f28374s.data

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Sep 26 2024'.
The library build time was '10:09:41'.
The library package version is '20.0.0.3178'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.