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器件型号：TMS320F28027 主题中讨论的其他器件：MSP-EXP432E401Y、 MSP432E401Y
尊敬的团队：
我的客户正在使用 板载 XDS110 (MSP-EXP432E401Y)来调试其定制 的 TMS320F28027板。 但 板载 XDS110无法调试 其定制 的 TMS320F28027板。
F28027板工作良好、因为独立的 XDS100V2和 XDS110仿真器可以对其进行调试。
CCS Test Connection Log [Start: Texas Instruments XDS110 USB Debug Probe] Execute the command: %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity [Result] -----[Print the board config pathname(s)]------------------------------------ C:\Users\ADMINI~1\AppData\Local\TEXASI~1\ CCS\ccs1011\0\0\BrdDat\testBoard.dat -----[Print the reset-command software log-file]----------------------------- This utility has selected a 100- or 510-class product. This utility will load the adapter 'jioxds110.dll'. The library build date was 'May 7 2020'. The library build time was '21:10:18'. The library package version is '9.2.0.00002'. The library component version is '35.35.0.0'. The controller does not use a programmable FPGA. The controller has a version number of '5' (0x00000005). The controller has an insertion length of '0' (0x00000000). This utility will attempt to reset the controller. This utility has successfully reset the controller. -----[Print the reset-command hardware log-file]----------------------------- The scan-path will be reset by toggling the JTAG TRST signal. The controller is the XDS110 with USB interface. The link from controller to target is direct (without cable). The software is configured for XDS110 features. The controller cannot monitor the value on the EMU[0] pin. The controller cannot monitor the value on the EMU[1] pin. The controller cannot control the timing on output pins. The controller cannot control the timing on input pins. The scan-path link-delay has been set to exactly '0' (0x0000). -----[An error has occurred and this utility has aborted]-------------------- This error is generated by TI's USCIF driver or utilities. The value is '-233' (0xffffff17). The title is 'SC_ERR_PATH_BROKEN'. The explanation is: The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. [End: Texas Instruments XDS110 USB Debug Probe]
客户尝试将 TCLK 频率降低至100kHz、500kHz、1MHz、2MHz、3MHz、 并且错误消息保持不变。
它们可以使用相同的方法来调试28035电路板。
使用独立 XDS110仿真器时的测试波形：
使用 板载 XDS110仿真器时的测试波形：
请帮助检查此问题。
