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[参考译文] TMS320F280049C：XDS100v2 USB 调试探针上的 JTAG DR Integrity scan-test 失败

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Guru**** 657930 points
Other Parts Discussed in Thread: TMDSCNCD280049C, TMDSHSECDOCK
请注意，本文内容源自机器翻译，可能存在语法或其它翻译错误，仅供参考。如需获取准确内容，请参阅链接中的英语原文或自行翻译。

https://e2e.ti.com/support/microcontrollers/c2000-microcontrollers-group/c2000/f/c2000-microcontrollers-forum/1221361/tms320f280049c-the-jtag-dr-integrity-scan-test-has-failed-on-xds100v2-usb-debug-probe

器件型号：TMS320F280049C
主题中讨论的其他器件：TMDSCNCD280049C、 TMDSHSECDOCK

您好 e2e、

一个月前 、我收到了 带有集线板 TMDSHSECDOCK 的控制卡 TMDSCNCD280049C、一直在尝试使用它们。 使用 CCS 平台的最初步骤始终失败、因为我从未成功测试与控制卡的连接。 我总是收到 以下错误-" JTAG DR 完整性扫描测试失败 "。  我尝试了以下测试设置：

1.将控制卡插入扩展坞后、两块板都通过 USB 连接到 PC、即扩展坞中的 J17通过 USB 连接到 PC (S1也通过 USB-ON 连接)、J1：A 输入控制卡也通过 USB 连接。 如下图所示、LED D1 (在 TMDSHSECDOCK 上)和 D2：A 和 D1 (在 TMDSCNCD280049C 上)都将亮起。 但是，我仍然得到 " JTAG DR 完整性扫描测试失败 "每次我都尝试测试连接。


2.  将 controlCard 插入对接板时，  TMDSHSECDOCK 中只有 J17是 USB 连接到 PC (S1也是 USB-ON)，我收到另一个错误。  软打开控制器时出错。 "请查看下面的设置、



3.在只  提供 USB 连接到控制卡 TMDSCNCD280049C 的情况下,我得到与第一例相同的连接失败错误, " JTAG DR 完整性扫描测试失败 "。 我明白，在所有情况下， 由于控制卡不接收 TMDSHSECDOCK 的电源，所以必须提供 USB 连接到 TMDSCNCD280049C (在 J1：A 上) 。 是这样吗？
下面是此设置的照片。

您能不能帮助弄清楚这些错误是什么以及如何解决这些错误？
谢谢。

  • 0
    TI__Guru**** 657930 points
    请注意，本文内容源自机器翻译，可能存在语法或其它翻译错误，仅供参考。如需获取准确内容，请参阅链接中的英语原文或自行翻译。

    情况1：这应该起作用。 请检查以下设置、如 controlCARD 用户指南中所述。 确保您的 CCS 目标配置使用的是 XDS100v2配置。 如果您不确定、请发布屏幕截图。

    情形2：这不起作用、因为您未通过 controlCARD USB 端口连接到 XDS100v2。

    情形3：这不起作用、因为 HSEC 集线站不为 controlCARD 供电。

  • 0
    TI__Guru**** 657930 points
    请注意，本文内容源自机器翻译，可能存在语法或其它翻译错误，仅供参考。如需获取准确内容，请参阅链接中的英语原文或自行翻译。

    我再次尝试了案例1、其中我在计算机和 J1：A 之间连接了 USB 电缆 另外、我按照表中所述布置了开关 S1：A 和 S1。 我仍然在 CCS 中得到相同的错误" JTAG DR 完整性扫描测试失败"。 请修改随附照片中的开关设置。

    我还在复制测试连接日志： 

    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\MohamedSaad\AppData\Local\Texas Instruments\
    CCS\ccs1220\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Nov 28 2022'.
The library build time was '16:30:46'.
The library package version is '9.10.0.00080'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS100v2 USB Debug Probe_0]

    您认为原因是什么？

  • 0
    TI__Guru**** 657930 points
    请注意，本文内容源自机器翻译，可能存在语法或其它翻译错误，仅供参考。如需获取准确内容，请参阅链接中的英语原文或自行翻译。

    让我澄清一下、在第1种情况下、您仍需要将 controlCARD 插入集线站。 集线站需要插入 USB 以便为 controlCARD 供电。 这在 controlCARD 用户指南(www.ti.com/.../spruic4)中进行了说明。

  • 0
    TI__Guru**** 657930 points
    请注意，本文内容源自机器翻译，可能存在语法或其它翻译错误，仅供参考。如需获取准确内容，请参阅链接中的英语原文或自行翻译。

    我已将 controlCARD 插入集线站、并将两根 USB 电缆连接到、如随附照片中所示。 遗憾的是、我仍然得到相同的误差。 

    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\MohamedSaad\AppData\Local\Texas Instruments\
    CCS\ccs1220\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Nov 28 2022'.
The library build time was '16:30:46'.
The library package version is '9.10.0.00080'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 6 bits.

The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS100v2 USB Debug Probe_0]

  • 0
    TI__Guru**** 657930 points
    请注意，本文内容源自机器翻译，可能存在语法或其它翻译错误，仅供参考。如需获取准确内容，请参阅链接中的英语原文或自行翻译。

    哪个错误？ 我看到扫描成功。 ：-)

    JTAG DR 完整性扫描测试已成功。

  • 0
    TI__Guru**** 657930 points
    请注意，本文内容源自机器翻译，可能存在语法或其它翻译错误，仅供参考。如需获取准确内容，请参阅链接中的英语原文或自行翻译。

    是的、这是正确的 Gus。 对不起、我没有注意到测试成功的最后一条消息。
    感谢您的巨大帮助。