[参考译文] xds110调试错误"值为'-233'(0xffffff17)。 标题为#39；sc_ERR_path_broken；#39；&quot；

您的目标配置文件将调试探针选择显示为"按序列号选择"、序列号为"ME401023"。 我认为序列号可以用于 Launchpad 上的板载 XDS110、它与目标断开连接、而不是用于 TMDSEMU110-U

我尝试了相同的配置、Launchpad USB 连接由与  TMDSEMU110-U 相同的 PC 供电 一次插入一个会导致 xdsdfu -e 显示：

• launchpad XDS110序列号为 ME401023
•  TMDSEMU110-U 序列号为 00000000

如果我使用 序列号为"ME401023"(launchpad)的"按序列号选择"、则测试连接失败、并显示 "C_ERR_PATH_BARRed"。

而如果 使用 序列号为"0000000000000000"( TMDSEMU110-U)的"按序列号选择"、则测试连接通过：

[Start: Texas Instruments XDS110 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

/home/mr_halfword/.ti/ccs1210/0/0/BrdDat/
    testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'libjioxds110.so'.
The library build date was 'Sep 20 2022'.
The library build time was '12:24:54'.
The library package version is '9.9.0.00040'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS110 USB Debug Probe_0]