Part Number: CCSTUDIO-C2000
将28034的程序从CCS3.3导入到CCS11，导入完成后，经编译没有错误。在烧录前，开发板上已有程序，并且该程序是加密的(密码知道)。当我把仿真器连接到开发板并且上电后，仿真器测试连接如下：
[Start: Texas Instruments XDS2xx USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\ADMINI~1\AppData\Local\TEXASI~1\
CCS\ccs1100\0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'Oct 8 2021'.
The library build time was '18:03:35'.
The library package version is '9.5.0.00143'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
This emulator does not create a reset log-file.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG IR Integrity scan-test has succeeded.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG DR Integrity scan-test has succeeded.
[End: Texas Instruments XDS2xx USB Debug Probe_0]
但是当我点击Run-->Conncet Target时弹出如下错误：
Error connecting to the target:
(Error -1015 @ 0x0)
Device is not responding to the request. Device may be locked, or the debug probe connection may be unreliable. Unlock the device if possible (e.g. use wait in reset mode, and power-cycle the board). If error persists, confirm configuration and/or try more reliable JTAG settings (e.g. lower TCLK).
(Emulation package 9.5.0.00143)
此时我看了一下开发板，发现此时开发板处于正常运行状态，也就是说没有在“等待”模式（或者复位状态）；为了让28034在连接仿真器前处于复位状态，上电前将复位信号强制拉低，然后继续按照上面的操作点击Conncet Target时，仿真器连接成功，在On-Chip Flash中输入正确密码也能解密。
我这里疑惑的是，我在CCS3.3环境下用XDS510时不需要上电前去将复位信号拉低就可以连接仿真器，而在CCS11环境下用XDS200时却需要这样做，这是为什么？难道是因为XDS200仿真器在连接过程中不支持复位CPU导致的？还请各位大佬解惑！
