Other Parts Discussed in Thread: C2000WARE
如题，开发项目时我尝试了使用两款不同的XDS110仿真器（如下图），我保证了2个测试条件都是一致的情况下：
图中1号仿真器能通过连接测试并且烧录成功，图中2号仿真器却不能通过连接测试出现报错（如下面报错内容），并且期间亮红灯闪烁；另外我多尝试了一个新的2号仿真器也是一样的现象，所以仿真器应该都是好的
开发环境：CCS12.0、C2000Ware_4_01_00_00、两款新买的XDS110仿真器和TI官网的开发板
希望能告知解决方法和查找问题的测试方法，谢谢！
两款XDS110实物图片：
仿真器2连接报错内容：
[Start: Texas Instruments XDS110 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\022800~1\AppData\Local\TEXASI~1\
CCS\ccs1200\0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100/110/510 class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Jun 17 2022'.
The library build time was '22:30:41'.
The library package version is '9.8.0.00235'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[An error has occurred and this utility has aborted]--------------------
This error is generated by TI's USCIF driver or utilities.
The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.
The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.
[End: Texas Instruments XDS110 USB Debug Probe_0]
另外我查看了两款仿真器电脑端口的识别，也是正确识别驱动如下图：
