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芯片失效率



有人知道SN 29500吗? 如果用SN29500去计算元器件在特定条件下的失效率的话,首先需要知道集成芯片内部包含的晶体管的数量(或门电路的数量),请问这个参数如何获取?只需要知道一个大概的数量即可。