我们的产品是采用MSP430F6736,上电初始化时候会调用IEC6070检测函数runPOST(), 有时候会出现CRC test failure,请问什么原因会造成该异常呢 ?
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我们的产品是采用MSP430F6736,上电初始化时候会调用IEC6070检测函数runPOST(), 有时候会出现CRC test failure,请问什么原因会造成该异常呢 ?
您好
请注意看一下,我给您分享的文档中有相关说明。
8.3.2.1 IEC60730_CRC_TEST_testNvMemory
The following function check for memory corruption in non volatile memory. The user must first calculate the CRC value of the memory to be checked. This can be achieved by using the CRC_tool which is included in the utils folders of the library. To learn how to use the CRC_tool please consult the IEC60730 Class B API User’s Guide. When the CRC value is obtain, the user must store the CRC value in FLASH before calling the function. The memorySize paramater is specified in 16 bit words and should not exceed 65535 16 bit words. The expectedCrc value is compared to the newly calculated CRC value. The test passes if the two CRC values are identical. NOTE: memorySize should be even an value, otherwise the the test fails.
这是原文,请您参考
您好
上电初始化时候出现了CRC test failure, 程序就无法往下跑了,但是再次上电又正常,都有哪些原因会出现这种可能呢 ? 文档中提到的CRC校验失败的判断计算方法,我们想知道什么原因可能会造成CRC校验失败呢,比如上电干扰,异常等,都有哪些可能呢 ?
核心问题是影响了相关寄存器进而影响了它的比较。比如上电初始化过程中收到干扰导致配置文档中提到寄存器的内容,进而影响到它后续比较。但是这个上电初始化过程存在的干扰不干涉到这个寄存器的配置。就没有影响。
您好
我们的MSP430F6736在低温环境下(-20°C)启动时容易出现IEC60730这个校验异常, 请问这是芯片的问题吗
芯片可以工作在-40~85℃,您查看在低温下供电是否稳定,以及外部电路是否在低温时启动无法保持稳定导致无法给MSP430F6736提供稳定的电源或者支持,导致上电初始化出现CRC相关寄存器错误进而报警