Other Parts Discussed in Thread: BQ76940, BQ78350,
各位工程师,想请教一个问题,基于BQ78350+BQ76940设计的14S电池管理系统,如图,调试发现FCHG置位了,FET_EN也使能了,没有显示处在安全保护状态,也没有找到处在保护状态的寄存器,但MOS不开,无法进行充放电测试,想问是什么原因呢?
This thread has been locked.
If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.
各位工程师,想请教一个问题,基于BQ78350+BQ76940设计的14S电池管理系统,如图,调试发现FCHG置位了,FET_EN也使能了,没有显示处在安全保护状态,也没有找到处在保护状态的寄存器,但MOS不开,无法进行充放电测试,想问是什么原因呢?
您好,The use of an activated fuse is apparently more system dependent for the higher cell count designs where the BQ78350-R1 is used. SAFE can be used to activate a fuse as noted in the data sheet section 8.3.2. That is interesting that we don't seem to have an example showing SAFE used to blow a fuse. SAFE could be used either with or without a secondary protector. The closest example which comes to mind would be http://www.ti.com/lit/pdf/sluuav7 section 5.2 schematic, although note the voltage limits of the BQ78350-R1 SAFE pin which is an output only. The FET must handle the system voltage and the current to activate the fuse, but also have a low enough VGSth to be turned on by the SAFE output high level and any components in series. Sometimes separate FETs are used for the gauge and protector.
请参考TRM 4.3 Enabling Use of the SAFE Pin
我也尝试重新刷过固件,但是刷完还是有问题,换了bq78350和MOS管驱动芯片才正常,我用的是旧芯片,怀疑就是旧芯片的问题了
我的也是旧芯片,之前折下的,重复使用,但我觉得这个芯片比较容易损坏。