BQ76930: VC1和VC0短路

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It is difficult to know exactly why these pins were damaged. When exactly in the manufacturing process was these discovered to be damaged?

It may be the way the cells are being attached, for best robustness they should connected starting from the bottom of the stack. They may want to add a Zener/Schottky diode on VC0 to protect the pin from too low or high voltages (This pin is a low-voltage pin). 

Additionally, it may be good to read Section 10 Random Cell Connection – Within Limits of the bq769x0 Family Top 10 Design Considerations application note.

It could also be that there was an ESD strike, were there ESD considerations done in their schematic/layout?

We have a stacked reference design that could be used as reference: TIDA-01093