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BQ76942: AFE 短路保护(SCD)误触发

Part Number: BQ76942

你好,我在BQ76942这款AFE配置了SCD保护,短路保护阈值为120A,但是在测试过程中会出现误报SCD的现象,在期间接的负载最大电流为3A,CC2电流采样也未出现超过3A的电流。

当触发了SCD故障,CHG、DSG FET会被断开。

尝试将 Protections:SCD:Threshold提高为100mV(电阻0.5毫欧姆,即短路电流阈值200A),仍然会频繁出现误报SCD的现象。

当我将SCD功能关闭后,不会出现该现象。

下图是我在调试时回读寄存器Safety status A的值:

显示触发了SCD故障。

保护功能的相关寄存器配置下:

//配置Enabled Protections A 见datasheet146 OCC SCD OCD1
u8WriteBuff[0] = 0x80;
ret_fg = bq76942_AFE_WRITE_FUNC(MEM_ENABLED_PROTECTIONS_A,1,u8WriteBuff, SUBCOMMAND);
delay_ms(55);

//配置Enabled Protections B 见datasheet146 COV CUV
u8WriteBuff[0] = 0x00;
ret_fg &= bq76942_AFE_WRITE_FUNC(MEM_ENABLED_PROTECTIONS_B,1,u8WriteBuff, SUBCOMMAND);
delay_ms(55);

//配置Enabled Protections C 见datasheet148 Host Watchdog Fault
u8WriteBuff[0] = 0x00;
ret_fg &= bq76942_AFE_WRITE_FUNC(MEM_ENABLED_PROTECTIONS_C,1,u8WriteBuff, SUBCOMMAND);
delay_ms(55);

//配置CHG FET Protections A 见datasheet148 OCC
u8WriteBuff[0] = 0x98; 
ret_fg &= bq76942_AFE_WRITE_FUNC(MEM_CHG_FET_PROTECTIONS_A,1,u8WriteBuff, SUBCOMMAND);
delay_ms(55);


//配置CHG FET Protections B 见datasheet148
u8WriteBuff[0] = 0x00;
ret_fg &= bq76942_AFE_WRITE_FUNC(MEM_CHG_FET_PROTECTIONS_B,1,u8WriteBuff, SUBCOMMAND);
delay_ms(55);

//配置CHG FET Protections C 见datasheet149
u8WriteBuff[0] = 0x00;
ret_fg &= bq76942_AFE_WRITE_FUNC(MEM_CHG_FET_PROTECTIONS_C,1,u8WriteBuff, SUBCOMMAND);
delay_ms(55);
#endif

//配置DSG FET Protections A 见datasheet150 OCD1和SCD
u8WriteBuff[0] = 0x80;
ret_fg &= bq76942_AFE_WRITE_FUNC(MEM_DSG_FET_PROTECTIONS_A,1,u8WriteBuff, SUBCOMMAND);
delay_ms(55);

//配置SCD:Threshold 见datasheet171 SCD
u8WriteBuff[0] = 3; //超过60mV(120A)切断DSG
ret_fg &= bq76942_AFE_WRITE_FUNC(MEM_SCD_THRESHOLD,1,u8WriteBuff, SUBCOMMAND);
delay_ms(55);

//配置SCD:Delay 见datasheet171 SCD
u8WriteBuff[0] = 17; //延时240us
ret_fg &= bq76942_AFE_WRITE_FUNC(MEM_SCD_DELAY,1,u8WriteBuff, SUBCOMMAND);
delay_ms(55);


//配置DSG FET Protections B 见datasheet150
u8WriteBuff[0] = 0x00;
ret_fg &= bq76942_AFE_WRITE_FUNC(MEM_DSG_FET_PROTECTIONS_B,1,u8WriteBuff, SUBCOMMAND);
delay_ms(55);

//配置DSG FET Protections C 见datasheet151
u8WriteBuff[0] = 0x00;
ret_fg &= bq76942_AFE_WRITE_FUNC(MEM_DSG_FET_PROTECTIONS_C,1,u8WriteBuff, SUBCOMMAND);
delay_ms(55);

  • 您好,您做的哪些测试触发SCD保护。

  • 就是正常的充电和放电,运行过程中会随机误报短路故障,导致DSG和CHG自行断开。

    (1)在测试期间,没有瞬间大电流的情况出现;
    (2)短路保护出现后会自行恢复;
    (3)电路中 SRP SRN间采样电阻是0.5mΩ;
    (4)   “13.6.7.2 Protections:SCD:Delay”设置为17(延时240us),
         “13.6.7.3 Protections:SCD:Recovery Time”采样默认设置(5s)。
     
    另外,在触发SCD保护前,读取0x7F FET status寄存器,DSG和CHG会显示为0,实际未断开,读取0x3A CC2 Current寄存器,电流跳为0A,实际应为3A。触发SCD保护后,DSG和CHG均断开。当关闭SCD保护时,不存在上述现象。
  • 您好,建议您用评估板做一下相同的测试,对比一下看是什么问题。