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C6678 GE网口loopback测试

经测试自己的板子 ddr 与 srio 都正常,基于ndk的网口也能正常工作

参照K1_STK_v1.1的gb工程,板子与EVM板只有sgmii时钟不同,所以只修改312.5->125,其他一样

但测试发现总卡死在void WaitForRxInterrupt(Uint32 uiStartCycles)函数中。下面是打印信息

JTAG ID= 0x1009e02f. This is C6678/TCI6608 device, version variant = 1.
DEVSTAT= 0x00001e21. little endian, No boot or EMIF16(NOR FLASH) or UART boot, PLL configuration implies the input clock for core is 100MHz.
SmartReflex VID= 59, required core voltage= 1.078V.
Die ID= 0x0901100b, 0x04045e45, 0x00000000, 0x48a00021
Device speed grade = 1000MHz.
Enable Exception handling...
Initialize DSP main clock = 100.00MHz/1x10 = 1000MHz
Initialize PASS PLL clock = 100.00MHz/2x21 = 1050.000MHz
Initialize DDR speed = 100.00MHzx/3x40 = 1333.333MTS
GE 1000M fullduplex internal SERDES loopback test...
SGMII0 port is not usable for test
waiting for GE RX interrupt timeout!
number of descriptors in host queue DDR_HOST_SIZE1_FDQ (2059) changed from 256 to 255
0x82344021->0x82344041->0x82344061->0x82344081->0x823440a1->0x823440c1->0x823440e1->0x82344101->0x82344121->0x82344141->...

请问为什么会出现这样情况,如何去排查问题?

谢谢!