This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

c6678 仿真器xds100v1连接失败

Other Parts Discussed in Thread: TMS320C6678

hi,
我用的是tmdsevm6678le评估板,芯片是tms320c6678,板子有两个jtag mini-usb接口,上面的是xds560的,下面的是xds100的,sw3~6选择no boot,根据BiosMulticoreSDK_2.1_GettingStartedGuide.pdf,选择new target configuration后点击test connection,出现如下情况,xds560v2可以正常连通,xds100v1无法正常连通,请各位大神多多指点,谢谢。


560v2

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End]

100

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End]

  • 在连xds100时需要将上面的560v2板子卸掉,否则默认仿真器选择的是560v2

  • hi Andy Yin1 ,

    非常感谢你的回答,我会按照你说的试一下,如果有新的进展会更新在这里,谢谢

  • hi Andy Yin1 ,

    你是正确的,按照你说的把上面的板子卸了就可以用xds100仿真器了,非常感谢,此问题已解答。

  • 你好,我也遇到过这个问题,板子只连接了一个仿真器,test connection就报错误, 目前没有解决,希望能得到解决方法,非常感激.

  • 你好,我也遇到过这个问题,板子只连接了一个仿真器,test connection就报错误, 目前没有解决,希望能得到解决方法,非常感激.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End]