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TMS320VC5502: Error connecting to the target: (Error -2172 @ 0xD) Unable to communicate with the debug probe. Confirm debug probe configuration and connections, reset the debug probe, and retry the operation. (Emulation package 8.4.0.00006)

Part Number: TMS320VC5502

各位先進大家好,當我按下"debug"鈕時會出現卡頓,然後如標題一樣出現error -2172。

1.我所使用的DSP板是自己的板子搭載C5502

2.使用XDS200 debug probe

3.CCS 從 V9~V12 都試過,皆為同個問題

4.debug的時候,執行的是Basic sample中的 Hello world

5.進行Test connection 看起來沒有問題,結果如下:

[Start: Texas Instruments XDS2xx USB Debug Probe]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\user\AppData\Local\TEXASI~1\CCS\
ccs930\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'Nov 25 2019'.
The library build time was '14:43:38'.
The library package version is '8.4.0.00006'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

This emulator does not create a reset log-file.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS2xx USB Debug Probe]

我盡可能將我能提供的資訊告訴各位,想請問各位先進在開發中有逾過類似的問題嗎?