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写的片上温度传感器采样，参考电压为内部电压，单独运行时很准，但是加载协议栈中后波动很大，难道是射频电路对采样影响？
建议多次采样取平均值！
我看CC2541的文档，其温度误差有5°C呢吧？
个人觉得是射频工作造成芯片温升吧。
如果要精确测量，建议外部temp sensor。
BR
