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器件型号：TMS570LC4357 主题中讨论的其他器件：TMDSEMU200-U
工具/软件：
尊敬的 TI 团队
我使用的电路板是 TMS570LC4357HDK。 该板上有一个 ARM 20引脚外部 JTAG 探针。我购买了 TMDSEMU200-U 仿真器。要使用此仿真器来仿真和刻录程序。
我遇到无法连接的问题。
1. 仿真器如下所示
2. 设备管理器列表如下所示
3. 连接如下
4. CCS 12.8.1配置如下
5. 测试连接错误日志如下所示。
[Start: Texas Instruments XDS2xx USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\TH\AppData\Local\TEXASI~1\CCS\ccs1281\
0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'Sep 26 2024'.
The library build time was '14:57:19'.
The library package version is '20.0.0.3178'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
This emulator does not create a reset log-file.
-----[An error has occurred and this utility has aborted]--------------------
This error is generated by TI's USCIF driver or utilities.
The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.
The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.
[End: Texas Instruments XDS2xx USB Debug Probe_0]
针对上述步骤、我想问是否可以通过这种方式使用仿真器、如果可以、我的步骤是否有问题？ 我对为什么报告错误感到困惑。
值得注意的是、我已重新安装了 TMDSEMU200-U 驱动程序。
请帮助分析问题,并尽快回复,非常感谢!
