大家好、
请告诉我如何独立测试此 XDS200 JTAG USB 探针(Blackhawk)？
探针通过 USB 连接并在设备管理器中被识别。当我尝试测试连接时、我收到以下错误。
连接到目标时出错： (错误-183 @ 0x0) 控制器本身检测到电缆断开。 用户必须将电缆/仓体连接到目标。
我在输出连接器 TI-20引脚连接器(也使用 TI-14引脚适配器)上没有获得任何 TCLK。
我检查了论坛中的一些讨论、但对上述错误不清楚。
我可以获得一些帮助吗？
谢谢、此致、
Venugopal B
我不是一名硬件人员、因此我无法回答有关信号的大量问题、但我可以帮助我们缩小问题范围。
我找到了 TMDS570LS31HDK 电路板。
如果我创建目标配置并使用板载 XDS100v2、这就是我在测试连接时看到的内容：
[Start: Texas Instruments XDS100v2 USB Debug Probe_0] Execute the command: %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity [Result] -----[Print the board config pathname(s)]------------------------------------ /Users/a0792138/.ti/ccs1200/0/0/BrdDat/testBoard.dat -----[Print the reset-command software log-file]----------------------------- This utility has selected a 100/110/510 class product. This utility will load the adapter 'libjioserdesusb.dylib'. The library build date was 'Jun 17 2022'. The library build time was '21:14:54'. The library package version is '9.8.0.00235'. The library component version is '35.35.0.0'. The controller does not use a programmable FPGA. The controller has a version number of '4' (0x00000004). The controller has an insertion length of '0' (0x00000000). This utility will attempt to reset the controller. This utility has successfully reset the controller. -----[Print the reset-command hardware log-file]----------------------------- The scan-path will be reset by toggling the JTAG TRST signal. The controller is the FTDI FT2232 with USB interface. The link from controller to target is direct (without cable). The software is configured for FTDI FT2232 features. The controller cannot monitor the value on the EMU[0] pin. The controller cannot monitor the value on the EMU[1] pin. The controller cannot control the timing on output pins. The controller cannot control the timing on input pins. The scan-path link-delay has been set to exactly '0' (0x0000). -----[The log-file for the JTAG TCLK output generated from the PLL]---------- There is no hardware for programming the JTAG TCLK frequency. -----[Measure the source and frequency of the final JTAG TCLKR input]-------- There is no hardware for measuring the JTAG TCLK frequency. -----[Perform the standard path-length test on the JTAG IR and DR]----------- This path-length test uses blocks of 64 32-bit words. The test for the JTAG IR instruction path-length succeeded. The JTAG IR instruction path-length is 6 bits. The test for the JTAG DR bypass path-length succeeded. The JTAG DR bypass path-length is 1 bits. -----[Perform the Integrity scan-test on the JTAG IR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG IR Integrity scan-test has succeeded. -----[Perform the Integrity scan-test on the JTAG DR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG DR Integrity scan-test has succeeded. [End: Texas Instruments XDS100v2 USB Debug Probe_0]
如果我使用连接了20引脚适配器的 XDS200、我会看到这一点。
下面是我的适配器的方向。 红线(1)靠近 SD 卡插槽。 我展示了这一点、因为 ARM20连接器没有键控、因此可以采用任何一种方式。
[Start: Texas Instruments XDS2xx USB Debug Probe_0] Execute the command: %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity [Result] -----[Print the board config pathname(s)]------------------------------------ /Users/a0792138/.ti/ccs1200/0/0/BrdDat/testBoard.dat -----[Print the reset-command software log-file]----------------------------- This utility has selected a 560/2xx-class product. This utility will load the program 'xds2xxu.out'. The library build date was 'Jun 18 2022'. The library build time was '03:06:08'. The library package version is '9.8.0.00235'. The library component version is '35.35.0.0'. The controller does not use a programmable FPGA. The controller has a version number of '13' (0x0000000d). The controller has an insertion length of '0' (0x00000000). This utility will attempt to reset the controller. This utility has successfully reset the controller. -----[Print the reset-command hardware log-file]----------------------------- This emulator does not create a reset log-file. -----[Perform the Integrity scan-test on the JTAG IR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG IR Integrity scan-test has succeeded. -----[Perform the Integrity scan-test on the JTAG DR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG DR Integrity scan-test has succeeded. [End: Texas Instruments XDS2xx USB Debug Probe_0]
我的 XDS200来自 Spectrum Digital、但它应该与 Blackhawk 相同。
如果您无法在 HDK 电路板上获得相同的结果、那么我会说您的 XDS200有问题。
此致、
John
