Other Parts Discussed in Thread: TMS320F28379D, TMDSCNCD28379D
您好！
我在新电路板上使用 TMS320F28379D。
原理图基于 TMDSCNCD28379D 原理图、适用于所有 MCU 功能(电源、支持、ADC、XDS100V2仿真器、仿真器接口)。
电源正常，但当我要加载程序时，我无法连接到 MCU：
我可以验证哪些要点来帮助我解决问题？ 我可以检查的任何信号？
感谢您的支持。
此致、
您好 Ki、
我已经下载了 FT_Prog，当我扫描时，我可以找到 EEPROM：
我使用初始参数成功地对 EEPROM 进行编程。
但是，要为独立模式设置什么设置？ 我在用户指南和 FT2232HL 数据表中找不到任何内容。
与 TMDSCNCD28379D 板上一样、JTAG 端口(ADBUS)连接到我板上的28379D。
我使用的原理图与 TMDSCNCD28379D 板完全相同、只是我没有连接 BDBUS0 (EMU_SCI-RX)和 BDBUS1 (EMU_SCI-TX)。 但这并不重要，因为只有端口 AD (JTAG)用于对 MCU 进行编程？
感谢您的支持。
此致、
您好 Ki、
因此、如果我在 EEPROM 中加载该程序：
程序加载到 EEPROM 中(编程后我没有刷新，这就是为什么我有“空白器件”)。
但是当我尝试连接 Code Composer 时，我会收到以下消息：
怎么了？ 我可以验证哪些点来解决此问题？
感谢您的支持。
此致、
看起来您打开了模板、但没有对 EEPROM 进行编程。
请参阅我执行的步骤：
1.扫描 XDS100v2
2. Apple XDS100v2模板
应用 XDS100v2模板后、您应该会收到如下消息：
对 EEPROM 进行编程
5、EEPROM 现在应该被编程(不是"空白器件"消息消失了、而是编程了"序列号")
请注意、FT_Prog 存在一个奇怪的问题、有时它不能正确编程、您 必须重试。 我不知道为什么、FT_Prog.出现 了一些错误行为
希望这起作用
Ki
您好 Ki、
这正是我所做的：
EEPROM 似乎已加载、即使"器件输出"与您的不同。
但是、当我尝试使用 Code Composer 连接到 MCU 时、我遇到了一个问题：
[Start: Texas Instruments XDS100v2 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\perriflo\AppData\Local\TEXASI~1\
CCS\ti\1\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Nov 21 2018'.
The library build time was '00:08:45'.
The library package version is '8.0.903.2'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[The log-file for the JTAG TCLK output generated from the PLL]----------
There is no hardware for programming the JTAG TCLK frequency.
-----[Measure the source and frequency of the final JTAG TCLKR input]--------
There is no hardware for measuring the JTAG TCLK frequency.
-----[Perform the standard path-length test on the JTAG IR and DR]-----------
This path-length test uses blocks of 64 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.
The JTAG IR Integrity scan-test has failed.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Debug Probe_0]
我可以检查哪些信号？
我可以验证哪些点来解决此问题？
感谢您的支持。
此致、
您好 Ki、
当我测试 JTAG 连接时、请查找直接作用于 MCU 芯片引脚上的不同 JTAG 信号。
MCU_TCK：
MCU_TDI：
MCU_TDO：
MCU_TMS：
MCU_TRSTN：
我已阅读可能的原因：
If the data read back is all ones (0xFFFFFFFF), it is possible that one of the JTAG lines has a short to VCC.
我认为我没有对 VCC 短路。
If using an isolated JTAG debug probe, it is possible that both scenarios may happen if the target board or device is powered down. In this case, make sure power is properly applied across the system. Most of the F28x development kits return 0xFFFFFFFF if the device section of the kit is powered down (if the kit has an isolated JTAG), if the jumper settings disable JTAG access or if the bootmode is set to anything other than JTAG. Please carefully review the documentation of your kit.
电路板上的所有电源看起来都正确(F28379电源和 JTAG 电源)
Certain devices such as F28x suggest a resistor to pull the TRST pin low. However, if the resistor is too small this error may manifest itself. This is reported in this e2e forum post.
TRST 高电平信号为3V3、因此我不认为这可能是问题的原因。
我可以做些什么来解决这个问题？ 我可以验证的任何一点
是否必须修改高级连接属性？
如何确保 MCU 正常工作？ /XRS 引脚的值必须是多少？
感谢您的支持。
此致、