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https://e2e.ti.com/support/power-management-group/power-management/f/power-management-forum/673579/tps3103-radiation-test-circuit
我正在寻找一个电路、此电路对于测试不同辐射剂量对 TPS3103芯片性能的影响非常有用。 电路应能够在辐射前、 辐射期间(如果可能)和之后测试相关性能。
目前是否有针对此应用的任何测试计划？
