TMS320F280049: 配置DCSM后，CCS无法下载再下载程序

https://e2echina.ti.com/support/microcontrollers/c2000/f/c2000-microcontrollers-forum/758269/tms320f280049-dcsm-dsp-boot_cfg-ccs

这两个问题是相关的吗？

那个帖子已经关闭了。

现在剩下这个问题无法解决。

没有配置DCSM时，CCS一直能够正常在线debug。

一旦配置DCSM并下载，就出现Error -1156。将此DSP焊下来，安装到另外一种类型的控制板上，仿真器能连接并下载程序。

下图是两种控制板的JTAG电路：

1.下载DCSM后出问题的控制板：

该板上JTAG经过简化，其与XDS100V3(14Pin)按下图进行连接：

信号     CN1     xdsv100

3.3V     1    ---   5    

GND     2   ---   4

空         3

TMS     4    ---   1

TDI       5   ---    3

TDO     6   ---    7

TCK      7   ---   9、11

3.3V     8    ---   5

2.下载DCSM后能正常在线仿真的控制板：

图中：13、14、2脚没有与DSP连接

尝试UniFlash得到如下错误提示：

无法下载，但是可以正常进行"Test Connection"操作：

[Start: Texas Instruments XDS100v3 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\bob\AppData\Local\TEXASI~1\CCS\
    ccs1110\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusbv3.dll'.
The library build date was 'Dec  8 2021'.
The library build time was '11:16:32'.
The library package version is '9.6.0.00172'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

  Test  Size   Coord      MHz    Flag  Result       Description
  ~~~~  ~~~~  ~~~~~~~  ~~~~~~~~  ~~~~  ~~~~~~~~~~~  ~~~~~~~~~~~~~~~~~~~
    1     64  - 01 00  500.0kHz   O    good value   measure path length
    2     64  + 00 00  1.000MHz  [O]   good value   apply explicit tclk

There is no hardware for measuring the JTAG TCLK frequency.

In the scan-path tests:
The test length was 2048 bits.
The JTAG IR length was 6 bits.
The JTAG DR length was 1 bits.

The IR/DR scan-path tests used 2 frequencies.
The IR/DR scan-path tests used 500.0kHz as the initial frequency.
The IR/DR scan-path tests used 1.000MHz as the highest frequency.
The IR/DR scan-path tests used 1.000MHz as the final frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 6 bits.

The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS100v3 USB Debug Probe_0]

重新找了一块全新的DSP，按以下步骤测试：
1。能正常下载和Debug未配置DCSM的程序，断电后程序正常运行，CCS可以再次下载和Debug，
2.第1次加密,使用简单密码,Zone1.PSWD3=0x12345678,Zone2.PSWD3=0x87654321，其他密码字段采用默认值，下载后程序正常运行，断电后程序正常运行，CCS可以再次下载和Debug(CCS中需设置密码)，
3.第2次加密,使用重复简单密码，
Zone1.PSWD0=Zone1.PSWD2=Zone1.PSWD3=0x12345678,Zone1.PSWD1=Default
Zone2.PSWD0=Zone2.PSWD2=Zone2.PSWD3=0x87654321,Zone2.PSWD1=Default
下载后，断电，程序正常运行，再次尝试Debug，出现 Error -1156，low-power提示