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函数如下SL_SelfTest_Flash(FLASH_ECC_TEST_MODE_1BIT, TRUE, &failInfoFlash);
定义如下boolean SL_SelfTest_Flash (SL_SelfTestType testType, boolean bMode, SL_SelfTest_Result * flash_stResult);
请问这个函数实现什么功能,另外我重定向printf函数之后调用printf程序遇到上面那个函数程序就会死掉,请问是我重定向出错了吗?
其次,我printf重定向之后可以输出字符串 例如printf("welcome");可以在串口上成功显示,但输出某个变量时则无法输出,例如 printf("%d\r\n",i);则什么都不显示,这是因为我重定向错误还是因为CCS哪里没有配置好?
附上我重定向的函数:
int fputc(int ch, FILE *f)
{
sciSendByte(sciREG1, (unsigned char)ch);
while ((sciREG1->FLR & 0x4) == 4);
return (ch);
}
恳请各位不吝赐教!
经过半天的摸索printf的问题解决了,大家可以参考这个网站进行printf函数的重定向http://processors.wiki.ti.com/index.php/Printf_support_for_MSP430_CCSTUDIO_compiler,但第一个问题还请各位赐教
Hi Jianing,
这个是Flash的自检函数, 具体的可以参考 TMS570 SafeTI Diagnostic Library的说明:
boolean SL_SelfTest_Flash | ( | SL_SelfTestType | testType, |
boolean | bMode, | ||
SL_SelfTest_Result * | flash_stResult | ||
) |
Executes diagnostic tests on F021 Flash.
Please refer to _SL_SelfTest_Type for the values to be used for testType
Note : Refer to Safety Manual for TMS570LS31x/21x and RM48x Hercules ARM Safety Critical Microcontrollers (section on Primary Embedded Flash and RM48x/TMS570LS31x 16/32-Bit RISC Flash Microcontroller TRM (section F021 Flash Module Controller)
Note: For FLASH_ECC_TEST_MODE_2BIT_FAULT_INJECT the fault is injected in the subsequent read of the corrupted flash area by the application. The application must take care to restore the flash diagnostic control registers . Note: FLASH_HARD_ERROR_LIVELOCK is not supported in this release.
[in] | testType | - Specifies the test type to execute |
[in] | bMode | - NOT USED |
[in] | flash_stResult | - Pointer to structure that is used to return the test status & results Note: contents of structure param1 is valid only for self-test.Not valid for Fault Injection mode. |
Example Usage:
TestType | Profiling Time in us |
---|---|
FLASH_ECC_ADDR_TAG_REG_MODE | 8.437 |
FLASH_ECC_TEST_MODE_1BIT | 7.3605 |
FLASH_ECC_TEST_MODE_2BIT | 13.3885 |
谢谢!