BQ40Z50-R1 AFE 的过流跟短路保护 真的 不能自己恢复吗

请参考技术参考文档里的相关描述，如下：

In general, when a fault is detected after the Delay time, both CHG and DSG FETs will be disabled (Trip
stage), and an internal fault counter will be incremented (Alert stage). Since both FETs are off, the current
will drop to 0 mA. After Recovery time, the CHG and DSG FETs will be turned on again (Recovery stage).

If the alert is caused by a current spike, the fault count will be decremented after Counter Dec Delay
time. If this is a persistent faulty condition, the device will enter the Trip stage after Delay time, and repeat
the Trip/Latch Alert/Recovery cycle. The internal fault counter is incremented every time the device goes
through the Trip/Latch Alert/Recovery cycle. Once the internal fault counter hits the Latch Limit, the
protection enters a Latch stage and the fault will only be cleared through the Latch Reset condition.

英文 看的有些蒙，你能不能大概帮我 描述一下 表达的意思。

我把AOLatch Limit 次数由0设置为100次，每次的短路后立马断开，这样就可以自动恢复。如果不断开，通讯也会断开，激活MOS后 通讯跟MOS都恢复正常。 

也就是说，报警的次数越过了设置的次数，就会进入锁住保护的阶段 latch stage。而出厂状态下为0次，所以一旦发生trip/latch/ alert 保护后，立马锁住，只能通过reset 恢复。