C6678的core1~7核加载成功；但core0加载失败，不清楚什么原因；请尽快协助分析和解决：
请您参阅以下步骤，尝试在eby上解决。
1. 比较“C6678 EVM”与“your-Custom-EVM”的原理图。
2. 您可以在此处找到 C6678 EVM 的原理图：https://www2.advantech.com/Support/TI-EVM/6678le_sd.aspx
3. 在定制板、原理图中，特别关注 XDS 板载仿真器部分。
4. 如果 XDS-Emulator 部分没有差异，请继续执行以下自定义板与 XDS 和 CCS 的“测试连接”步骤。
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步骤1：
检查是否有针对仿真器/调试模式的 DIP 开关设置。
例如，在 TI-C6678 EVM 中，它被称为“NO -boot 模式”。
DIP 开关设置 - “NO-Boot-Mode” - 适用于 Ti-C6678 EVM
SW6：1 1 1 1
SW5：1 1 1 1
SW4：1 1 1 1
SW3：0 1 1 1
首先请按照此处给出的步骤执行“测试连接过程”，然后将输出控制台消息发布给我。
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C6678 EVM 和 TEST -CONNECTION 选项的 cxml 文件设置：
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CCS中的测试连接输出：
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完成 - 成功的 JTAG 连接输出将如下所示：
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The JTAG IR instruction path-length is 6 bits. The test for the JTAG DR bypass path-length succeeded. The JTAG DR bypass path-length is 1 bits. -----[Perform the Integrity scan-test on the JTAG IR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG IR Integrity scan-test has succeeded. -----[Perform the Integrity scan-test on the JTAG DR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG DR Integrity scan-test has succeeded. [End: Texas Instruments XDS100v1 USB Debug Probe_0]
