• 状态 TI Thinks Resolved
  • 已锁定 已锁定
  • 回复 1 回复
  • 答案 1 答案
  • 订户 13 订户
  • 视图 690 视图
  • 用户 0 会员在此处
选项
选项
相关

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

TS3USB30E: -3DB bandwidth test

? ?
Prodigy 20 points
Part Number: TS3USB30E

Hello:

I'd like to summarize my problem by measuring the parameters of your company's TS3USB30E -3DB bandwidth right now.

According to the measurement method provided in your company's specifications, it is to continuously increase the signal frequency at the input end until 900Mhz to observe whether the output amplitude becomes 0.707;

However, due to the limited equipment of our test equipment, the signal generator we use can only increase the signal frequency up to 350Mhz, which makes this parameter difficult to measure; I also know whether the spectrum analyzer can be used to observe this parameter, but according to your company's requirements, you need to add a DC bias of 350mv at the same time, and the spectrum analyzer isolates DC.

1. Therefore, it is not possible to measure this parameter, how does your company measure this parameter?

2. What instruments and equipment are used, can you describe the test method in detail, how to give the signal and add bias?

3. Can we give some solutions to our current situation?

  • 0
    TI__Mastermind 36650 points

    There isn't one set way to measure this. This device in particular wasn't owned by the MUX team until recently so I can't speak for how the HSSC team who used to own it did their measurements but I can say typically on the MUX team we have a VNA that has an internal bias tee. 

    The specific make and model isn't something we'll share but the layout for our testing is shown in the datasheet. But as mentioned our equipment handles it with the help of an external power supply. 

    All that being said, I'm not sure I follow the ask here. Why are they trying to re-characterize the device with equipment that can't support the frequency required.
    I'm not sure if there is a good solution here. As you approach higher frequencies (hundres of MHz - 1GHz and above) the layout, equipment, cables, etc all make a difference to get proper measurements to isolate as much of the devices specs as possible. But if the can only increase their frequency to 350MHz then there's nothing we can do unless they get equipment that can go higher.
    As for the DC bias part they would have to bias the signal before it gets to the mux with a bias tee at the input. Then decouple the DC signal with a series cap that would let the AC pass through but block the DC.