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ccs6.0 里launch selected configuration失败,为什么?

     ccs6.0 里编译成功后,点击 launch selected configuration 失败,显示disconnected unknown。dsp为28335,仿真器瑞泰创新的xds200u。

     配置目标文件里选的是xds 200 usb emulator,TMS320F28335;仿真器驱动应该是装好了,端口里显示xds2xx Emulator CDC Serial Port (COM9) 和xds2xx User CDC Serial Port (10)。

    另外如何reset emulator。

     Test configuration如下

Test configuration

[Start: Texas Instruments XDS2xx USB Emulator_0]

 

Execute the command:

 

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

 

[Result]

 

 

-----[Print the board config pathname(s)]------------------------------------

 

C:\DOCUME~1\ADMINI~1\LOCALS~1\APPLIC~1\TEXASI~1\

    CCS\TI\0\0\BrdDat\testBoard.dat

 

-----[Print the reset-command software log-file]-----------------------------

 

This utility has selected a 560/2xx-class product.

This utility will load the program 'xds2xxu.out'.

The library build date was 'May 21 2014'.

The library build time was '18:02:25'.

The library package version is '5.1.507.0'.

The library component version is '35.34.40.0'.

The controller does not use a programmable FPGA.

The controller has a version number of '13' (0x0000000d).

The controller has an insertion length of '0' (0x00000000).

This utility will attempt to reset the controller.

This utility has successfully reset the controller.

 

-----[Print the reset-command hardware log-file]-----------------------------

 

This emulator does not create a reset log-file.

 

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

 

This test will use blocks of 512 32-bit words.

This test will be applied just once.

 

Do a test using 0xFFFFFFFF.

Scan tests: 1, skipped: 0, failed: 0

Do a test using 0x00000000.

Scan tests: 2, skipped: 0, failed: 0

Do a test using 0xFE03E0E2.

Scan tests: 3, skipped: 0, failed: 0

Do a test using 0x01FC1F1D.

Scan tests: 4, skipped: 0, failed: 0

Do a test using 0x5533CCAA.

Scan tests: 5, skipped: 0, failed: 0

Do a test using 0xAACC3355.

Scan tests: 6, skipped: 0, failed: 0

All of the values were scanned correctly.

 

The JTAG IR Integrity scan-test has succeeded.

 

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

 

This test will use blocks of 512 32-bit words.

This test will be applied just once.

 

Do a test using 0xFFFFFFFF.

Scan tests: 1, skipped: 0, failed: 0

Do a test using 0x00000000.

Scan tests: 2, skipped: 0, failed: 0

Do a test using 0xFE03E0E2.

Scan tests: 3, skipped: 0, failed: 0

Do a test using 0x01FC1F1D.

Scan tests: 4, skipped: 0, failed: 0

Do a test using 0x5533CCAA.

Scan tests: 5, skipped: 0, failed: 0

Do a test using 0xAACC3355.

Scan tests: 6, skipped: 0, failed: 0

All of the values were scanned correctly.

 

The JTAG DR Integrity scan-test has succeeded.

 

[End: Texas Instruments XDS2xx USB Emulator_0]